Robust incident angle calibration of angle-resolved ellipsometry for thin film measurement

Principal angle, principal azimuth, and principal-angle ellipsometry of film-substrate systems

Angle-Resolved Reflectivity Analysis of Textured Substrates for Liquid-Phase Crystallized Silicon Thin-Film Solar Cells

Angular dependency of the reflectivity of two distinct nano-textured and planar reference liquid-phase crystallized silicon solar cells are investigated. We show that nano-textured layers outperform planar devices for all incident angles. OCIS codes: 040.5350, 310.6845

Angle-resolved scattering: an effective method for characterizing thin-film coatings.

Light scattered from interface imperfections carries valuable information about its origins. For single surfaces, light-scattering techniques have become a powerful tool for the characterization of surface roughness. For thin-film coatings, however, solving the inverse scattering problem seemed to be impossible because of the large number of parameters involved. A simplified model is presented ...

Molecular dynamics simulation of thin film nucleation through molecular cluster beam deposition: Effect of incident angle

Deposition of organic cluster beams on solid substrates leads to the creation of thin films through rapid chemical reactions, which makes the process suitable for study by molecular dynamics (MD) simulations. In this work, angular effects of molecular organic beam deposition are studied extensively through classical MD simulations. The reactive empirical bond potential parameterized by Brenner ...

From angle-resolved ellipsometry of light scattering to imaging in random media.

A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight depart...